Ūļc\(International Conference)Xg
yµŅu(Invited)z
- M. Furuta, T. Matsuda, T. Hiramatsu, H. Furuta, T. Hirao, H. Hokari, and M. Yoshida, gCharacterization of Sputter Deposited ZnO Thin Film and Its Application to Thin-Film Transistorsh, 13th International Display Workshops (IDW f06) (2006, Shiga, Japan)
- T. Hirao, M. Furuta, and T. Hiramatsu, gZnO-based TFT for use in LCDh, International Conference on Metallurgical Coatings and Thin Films (2008, USA)
- T. Hirao, M. Furuta, and T. Hiramatsu, T. Matsuda, gZnO TFT for use in LCDh, Taiwan Display Workshop (2008, Taipei, Taiwan)
- T. Hirao, M. Furuta, T. Hiramatsu, H. Nitta, and T. Matsuda, gSynthesis of ZnO and its application to sophisticated devicesh, International Display Manufacturing Conference /Asia Display 2009 (2009, Taipei, Taiwan)
- T. Hirao, M. Furuta, T. Hiramatsu, H. Nitta, and T. Matsuda, gSynthesis of ZnO and its application to sophisticated devicesh, International Display Manufacturing Conference /Asia Display 2009 (2009, Taipei, Taiwan)
- S. Aihara, H. Seo, M. Kubota, N. Egami, T. Hiramatsu, M. Furuta, and T. Hirao, gStacked Image Sensor using Organic Photoconductive Films with ZnO TFT Readout Circuitsh, 16th International Display Workshops (IDW f09) (2009, Miyazaki, Japan)
- M. Furuta, T. Hiramatsu, T. Matsuda, T. Hirao, T. Nakanishi, and M. Kimura,gEffect of Channel/Gate-insulator Interface Treatment on Uniformity of Bottom-Gate Zinc Oxide Thin-Film Transistors (ZnO TFTs)h, The 6th International Thin-Film Transistor Conference (ITC e10) (2010, Himeji, Japan)
- M. Furuta, T. Hiramatsu, T. Matsuda, and T. Hirao, gEffects of Interfacial Processes of Gate Dielectric on Electrical Properties and Reliability of Bottom-Gate ZnO TFTs.h, 10th International Meeting on Information Display/International Display Manufacturing Conference and Asia Display 2010 (IMID/IDMC/ASIA DISPLAY 2010) (2010, Seoul, Korea)
yźŹuz
y2010Nz
- M. Furuta, T. Hiramatsu, T. Matsuda, T. Hirao, T. Nakanishi, and M. Kimura, gEffect of Channel/Gate-insulator Interface Treatment on Uniformity of Bottom-Gate Zinc Oxide Thin-Film Transistors (ZnO TFTs)h, The Proceedings of the 6th International Thin-Film Transistor Conference (ITC e10), (2010, Himeji, Japan) pp.18-21
- H. Seo, S. Aihara, M. Nambu, T. Watabe, H. Ohtake, M. Kubota, N. Egami, T. Hiramatsu, T. Matsuda, M. Furuta, H. Nitta, and T. Hirao, gStacked color image sensor using wavelength-selective organic photoconductive film with zinc oxide thin-film transistors as a signal readout circuith, Proceedings of SPIE, Sensors, Cameras, and Systems for Industrial/Scientific Applications XI, 7356 (2010) 753602
- Y. Kamada, S. Fujita, T. Hiramatsu, T. Matsuda, M. Furuta, T. Hirao, gPhoto-Leakage Current in ZnO TFTs for Transparent Electronics g, 2010 SID (Society for Information Display) International Symposium Digest of Technical Papers, (2010, Seattle, USA)
- M. Furuta, Y. Kamada, T. Hiramatsu, C. Li, S. Fujita, and T. Hirao, gBias-Temperature Instability in ZnO TFTs with a Stacked Gate Insulator g, The Proceedings of AM-FPD f10 (17th international Workshop on Active-Matrix Flatpanel Displays and Devices), (2010, Tokyo, Japan) pp.133-135
- D. Wang, C. Li, T. Kawaharamura, T. Matsuda, M. FurutaAT. Hirao, and T. Narusawa, gLow Temperature Post-annealing Effects on Structural and Optical Properties of Zn0.9Mg0.1O Thin Film Prepared by Radio Frequency Magnetron Sputteringh, The Proceedings of AM-FPD f10 (17th international Workshop on Active-Matrix Flatpanel Displays and Devices), (2010, Tokyo, Japan) pp.187-190
- C. Li, D. Wan, T. Kawaharamura, M. Furuta, and T. Hirao, "Characterization of ZnMgO/ZnO Thin Films Prepared by by Radio Frequency Magnetron Sputteringh, The Proceedings of AM-FPD f10 (17th international Workshop on Active-Matrix Flatpanel Displays and Devices), (2010, Tokyo, Japan) pp.183-186
- M. Furuta, T. Hiramatsu, T. Matsuda, and T. Hirao, gEffects of Interfacial Processes of Gate Dielectric on Electrical Properties and Reliability of Bottom-Gate ZnO TFTs.h, Proceedings of the 10th International Meeting on Information Display/International Display Manufacturing Conference and Asia Display 2010 (IMID/IDMC/ASIA DISPLAY 2010), (2010, Seoul, Korea)
- Y. Kamada, S. Fujita, T. Hiramatsu, T. Matsuda, M. Furuta, and T. Hirao, gRole of Film Properties in subthreshold Characteristics of Zinc Oxide Thin-Film Transistorsh, Proceedings of the 10th International Meeting on Information Display/International Display Manufacturing Conference and Asia Display 2010 (IMID/IDMC/ASIA DISPLAY 2010), (2010, Seoul, Korea)
- C. Li, D. Wang, T. Kawaharamura, T. Matsuda, H. Furuta, T. Hiramatsu, M. Furuta, and T. Hirao, gEffect of high pressure water vapor annealing on photoluminescent and structural properties of nano-structured ZnO/ZnMgO multiple layers prepared by radio frequency magnetron sputteringh, Proceedings of the 10th International Meeting on Information Display/International Display Manufacturing Conference and Asia Display 2010 (IMID/IDMC/ASIA DISPLAY 2010), (2010, Seoul, Korea)
y2009Nz
- C. Li, T. Kawaharamura, T. Matsuda, H. Furuta, T. Hiramatsu, M. Furuta, and T. Hirao, gFabrication of High Efficient Green Emission Zinc Oxide Films at Low Temperature by Radio Frequency Magnetron Sputteringh, 2009 SID (Society for Information Display) Digest of Technical Papers, (2009, Texas, USA) pp.1456-1459
- M. Furuta, T. Hiramatsu, T. Matsuda, H. Nitta, H. Furuta, C. Li, and T. Hirao, gStability of Zinc Oxide Thin-Film Transistors (ZnO TFTs)h, The Proceedings of AM-FPD f09 (16th International Workshop on Active-Matrix Flatpanel Displays and Devices), (2009, Nara, Japan) pp.89-92
- T. Hiramatsu, T. Matsuda, H. Furuta, H. Nitta, T. Kawaharamura, C. Li, M. Furuta and T. Hirao, gHigh quality SiO2 deposited at 150 C by inductively coupled plasma chemical vapor deposition with pulsed substrate biash, The Proceedings of AM-FPD f09 (16th International Workshop on Active-Matrix Flatpanel Displays and Devices), (2009, Nara, Japan) pp.219-222
- Y. Kamada, S. Fujita, T. Hiramatsu, T. Matsuda, H. Nitta, M. Furuta, and T. Hirao, gPhoto leakage current of ZnO TFTs in the visible lighth, The Proceedings of AM-FPD f09 (16th International Workshop on Active-Matrix Flatpanel Displays and Devices), (2009, Nara, Japan) pp.65-66
- C. Li, T. Matsuda, Y. Nakanishi, K. Ichinomiya, M. Furuta, T. Hiramatsu, H. Furuta, T. Kawaharamura, and T. Hirao, gComparison of different annealing gases effects on the optical emission properties of zinc oxide films deposited by radio frequency sputteringh, Technical Digest of 2009 22th International Vacuum Nanoelectronics Conference, (2009, Hamamatsu, Japan) pp.63-64
- M. Furuta, T. Hiramatsu, H. Furuta, and T. Hirao, gCrystallinity of microcrystalline silicon deposited by ICP-CVD with bipolar pulse substrate biash, Proceedings of the 16th International Display Workshops (IDW e09), (2009, Miyazaki, Japan) pp.287-288
- S. Aihara, H. Seo, M. Kubota, N. Egami, T. Hiramatsu, M. Furuta, and T. Hirao, gStacked image sensor using organic photoconductive films with ZnO TFT readout circuitsh, Proceedings of the 16th International Display Workshops (IDW f09), (2009, Miyazaki, Japan) pp. 2119-2122
- C. Li, T. Matsuda, T. Kawaharamura, Y. Nakanishi, K. Ichinomiya, H. Furuta, T. Hiramatsu, M. Furuta, and T. Hirao, gLow temperature annealing effects on ZnO thin films sputtering deposited on [100] silicon substrateh, Proceedings of the 16th International Display Workshops (IDW e09), (2009, Miyazaki, Japan) pp.983-984
y2008Nz
- M. Furuta, T. Hiramatsu, T. Matsuda, H. Nitta, and T. Hirao, gInvestigation of Instability Mechanisms in Zinc Oxide Thin-Film Transistors under Bias Stressesh, Proceedings of the 15th International Display Workshops (IDW e08), (2008, Niigata, Japan) pp.1633-1636
- H. Furuta, T. Kawaharamura, K. Kawabata, M. Furuta, A. Hatta, K. Ishii, K. Okada, T. Komukai, Y. Morioka, T. Matsuda, C. Li and T. Hirao, gFabrication of Directly Grown Vertically Aligned CNT Pattern Emitter on Glassh, Proceedings of the 15th International Display Workshops (IDW e08) (2008, Niigata, Japan) pp.2041-2044
y2007Nz
- M. Furuta, H. Tsubokawa, K. Shimamura and T. Hirao, gActivation Behavior of Boron Implanted Poly-Si Films Annealed by Rapid Thermal Processh Proceedings of the 14th International Display Workshops (IDW e07), (2007, Sapporo, Japan) pp.569-571
- M. Furuta, C. Li, T. Matsuda, H. Furuta, T. Hirao, M. Tachikawa, and T. Hiramatsu, gEffect of microstructure on optical properties of rf-sputtered ZnO films for ZnO TFTsh, Proceedings of the 14th International Display Workshops (IDW e07), (2007, Sapporo, Japan) pp.573-576
- T. Hiramatsu, M. Furuta, C. Li, H. Furuta, T. Matsuda, and T. Hirao, gInfluence of Ar Gas on Inductively Coupled Plasma Etching of ZnO Film in CH4/Arh, Proceedings of the 14th International Display Workshops (IDW e07), (2007, Sapporo, Japan) pp.577-579
- C. Li, M. Furuta, H. Furuta, T. Matsuda, T. Hiramatsu, H. Furuta and T. Hirao, gCharacterization of ZnO Films Fabricated by Radio Frequency Magnetron Sputtering under Different Substrate Temperatures for TFTs Applicationh, Proceedings of the 14th International Display Workshops (IDW e07), (2007, Sapporo, Japan) pp.565-568
- T. Matsuda, M. Furuta, T. Hiramatsu, H. Furuta, C. Li, and T. Hirao, gElectrical properties of ion implanted ZnO thin film for source and drain regions of ZnO TFTsh, Proceedings of the 14th International Display Workshops (IDW e07), (2007, Sapporo, Japan) pp.561-564
- H. Furuta, T. Hiramatsu, T. Matsuda, C. Li, M. Furuta, and T. Hirao, gFilm quality of low-temperature synthesized SiO2 insulator deposited by ICP-CVD using tetramethylsilaneh, Proceedings of the 14th International Display Workshops (IDW e07), (2007, Sapporo, Japan) pp.553-556
- H. Furuta, M. Furuta, S. Honda, M. Katayama, K. Oura, and T. Hirao, gSimulation Study of Bundle CNT Emitter Array for Field Emission Devicesh, Proceedings of the 14th International Display Workshops (IDW e07), (2007, Sapporo, Japan) pp.2193-2195
y2006Nz
- T. Hirao, M. Furuta, H. Furuta, T. Matsuda, T. Hiramatsu, H. Hokari, M. Yoshida, gHigh-Mobility Top-Gate Zinc Oxide Thin-Film Transistors (ZnO-TFTs) for Active-Matrix Liquid Crystal Displaysh, 2006 SID (Society for Information Display) International Symposium Digest of Technical Papers, (2006, San Francisco, USA) pp.17-19
- M. Furuta, T. Matsuda, T. Hiramatsu, H. Furuta, T. Hirao, H. Hokari, and M. Yoshida, gCharacterization of Sputter Deposited ZnO Thin Film and Its Application to Thin-Film Transistorsh, Proceedings of the 13th International Display Workshops (IDW f06) (2006, Shiga, Japan) pp.677-680
- H. Furuta, M. Furuta, T. Matsuda, T. Hiramatsu, and T. Hirao gLow-Temperature Synthesis of SiO2 Insulator by ICP-CVD using Tetramethylsilaneh, Proceedings of the 13th International Display Workshops (IDW e06), (2006, Shiga, Japan) pp.973-975
- T. Hiramatsu, M. Furuta, T. Matsuda, H. Furuta, and T. Hirao, gInfluence of Deposition Pressure on Thermal Stability of ZnO Films Deposited by RF Magnetron Sputteringh, Proceedings of the 13th International Display Workshops (IDW e06), (2006, Shiga, Japan) pp.983-985